JPS Conf. Proc. 33, 011068 (2021) [6 pages]
Proceedings of the 3rd J-PARC Symposium (J-PARC2019)
Position Dependency of the Scattered Intensity in the Time-of-flight Backscattering Spectrometer DNA
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1Neutron Science and Technology Center, CROSS, Tokai, Ibaraki 319-1106, Japan
2Materials Sciences Research Center, JAEA, Tokai, Ibaraki 319-1195, Japan
3J-PARC Center, Tokai, Ibaraki 319-1195, Japan
Received January 10, 2020
The position dependency of the scattered intensity in the time-of-flight backscattering spectrometer DNA was investigated. A periodic structure for both vertical (pixel) and horizontal (PSD) directions was observed. The Soller slit and over-bending of an analyzer crystal is discussed as a possible origin of the modulation in the intensity. We have developed software program for the systematic correction of the position-dependent intensity and offset energy for the elastic peak. This corrects the deviation from the true scattering intensity and improves the quality of the data, which includes the energy resolution.
©2021 The Author(s)
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