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We demonstrate the electrical and thermal transport of the layered bismuth-based sulfide EuBiS2F from 300 to 623 K. Although significant hybridization between Eu 4f and Bi 6p electrons was reported previously, the carrier transport of the compound is similar to that of F-doped LaBiS2O, at least above 300 K. The lattice thermal conductivity is lower than that of isostructural SrBiS2F, which is attributed to the heavier atomic mass of Eu ions than that of Sr ions.
Searching for novel thermoelectric materials is the most fundamental issue for the development of thermoelectrics because the maximum conversion efficiency of a thermoelectric device is primarily determined by the material's dimensionless figure of merit,
Figure 1. (Color online) XRD pattern of EuBiS2F and the results of Rietveld analysis. The arrows denote the diffraction peaks due to unknown impurities. The lattice parameters were calculated to be
Polycrystalline EuBiS2F was prepared by a solid-state reaction using a sealed silica tube, following the method reported by Zhai et al.9) The sample purity was examined by X-ray diffraction (XRD) collected using Cu Kα radiation (Rigaku RINT 2500). Rietveld analysis was performed using the RIETAN-FP code.11) The relative density of the sample was calculated to be 90%.
The Hall coefficient (
Figure 1 shows the XRD pattern of the sample and the results of Rietveld refinement. Almost all diffraction peaks corresponded to those of the EuBiS2F phase, indicating that this phase was dominant in the samples. Although diffraction peaks due to unknown impurities were also observed, the diffraction intensities of the impurity phases relative to those of EuBiS2F were ∼1%, suggesting that the amount of impurities was at these levels in the sample. The bond valence sum (BVS) of Eu was calculated to be 2.16(1),13,14) which was consistent with the previously reported value,9) indicating electron doping into the BiS2 conduction layer. The negative polarity of
Figure 2 shows the electrical and thermal transport properties versus the temperature of EuBiS2F. ρ is 3.9 mΩ cm at 300 K and it slightly decreases with increasing temperature, as shown in Fig. 2(a). On the other hand, Zhai et al. reported ρ of ∼2.2 mΩ cm at 300 K with a positive temperature coefficient (
Figure 2. (Color online) (a) Electrical resistivity (ρ), (b) Seebeck coefficient (S), and (c) thermal conductivity (κ) of EuBiS2F.
Figure 2(b) shows S as a function of temperature. The absolute value of S is ∼32 µV K−1 at 300 K and it increases almost linearly up to 623 K. Both ρ–T and S–T plots are similar to those of LaBiS2O
Figure 2(c) shows the total thermal conductivity (
We briefly discuss a possible method of improving
In summary, we demonstrated the electrical and thermal transport of the layered bismuth-based sulfide EuBiS2F at temperatures between 300 and 623 K. Although significant hybridization between Eu
Acknowledgments
This work was partially supported by research grants from Keio University, the Keio Leading-edge Laboratory of Science and Technology (KLL), Japan Society for the Promotion of Science (JSPS) KAKENHI Grant Numbers 25707031 and 26400337, and the Asahi Glass Foundation.
References
- 1 G. J. Snyder and E. S. Toberer, Nat. Mater. 7, 105 (2008). 10.1038/nmat2090 Crossref, Google Scholar
- 2 H. J. Goldsmid and R. W. Douglas, Br. J. Appl. Phys. 5, 386 (1954); 10.1088/0508-3443/5/11/303 Crossref;, Google ScholarB. Poudel, Q. Hao, Y. Ma, Y. Lan, A. Minnich, B. Yu, X. Yan, D. Wang, A. Muto, D. Vashaee, X. Chen, J. Liu, M. S. Dresselhaus, G. Chen, and Z. Ren, Science 320, 634 (2008). 10.1126/science.1156446 Crossref, Google Scholar
- 3 K. Suekuni, K. Tsuruta, M. Kunii, H. Nishiate, E. Nishibori, S. Maki, M. Ohta, A. Yamamoto, and M. Koyano, J. Appl. Phys. 113, 043712 (2013); 10.1063/1.4789389 Crossref;, Google ScholarY. He, T. Day, T. Zhang, H. Liu, X. Shi, L. Chen, and G. J. Snyder, Adv. Mater. 26, 3974 (2014). 10.1002/adma.201400515 Crossref, Google Scholar
- 4 Y. Mizuguchi, H. Fujihisa, Y. Gotoh, K. Suzuki, H. Usui, K. Kuroki, S. Demura, Y. Takano, H. Izawa, and O. Miura, Phys. Rev. B 86, 220510 (2012). 10.1103/PhysRevB.86.220510 Crossref, Google Scholar
- 5 Y. Mizuguchi, S. Demura, K. Deguchi, Y. Takano, H. Fujihisa, Y. Gotoh, H. Izawa, and O. Miura, J. Phys. Soc. Jpn. 81, 114725 (2012). 10.1143/JPSJ.81.114725 Link, Google Scholar
- 6 Z. Hiroi, arXiv:0805.4668. Google Scholar
- 7 A. Omachi, J. Kajitani, T. Hiroi, O. Miura, and Y. Mizuguchi, J. Appl. Phys. 115, 083909 (2014). 10.1063/1.4867186 Crossref, Google Scholar
- 8 Y. Mizuguchi, A. Omachi, Y. Goto, Y. Kamihara, M. Matoba, T. Hiroi, J. Kajitani, and O. Miura, J. Appl. Phys. 116, 163915 (2014). 10.1063/1.4900953 Crossref, Google Scholar
- 9 H. F. Zhai, Z. T. Tang, H. Jiang, K. Xu, K. Zhang, P. Zhang, J. K. Bao, Y. L. Sun, W. H. Jiao, I. Nowik, I. Felner, Y. K. Li, X. F. Xu, Q. Tao, C. M. Feng, Z. A. Xu, and G. H. Cao, Phys. Rev. B 90, 064518 (2014). 10.1103/PhysRevB.90.064518 Crossref, Google Scholar
- 10 A. Bentien, S. Johnsen, G. K. H. Madsen, B. B. Iversen, and F. Steglich, Europhys. Lett. 80, 17008 (2007). 10.1209/0295-5075/80/17008 Crossref, Google Scholar
- 11 F. Izumi and K. Momma, Solid State Phenom. 130, 15 (2007). 10.4028/www.scientific.net/SSP.130.15 Crossref, Google Scholar
- 12 Y. Goto, Y. Sakai, Y. Kamihara, and M. Matoba, J. Phys. Soc. Jpn. 84, 044706 (2015). 10.7566/JPSJ.84.044706 Link, Google Scholar
- 13 N. E. Brese and M. O’Keeffe, Acta Crystallogr., Sect. B 47, 192 (1991). 10.1107/S0108768190011041 Crossref, Google Scholar
- (14) The BVS were calculated using the following parameters: \(b_{0} = 37\) pm for all atomos, and \(R_{0} = 204\) and 253 pm for Eu–F and Eu–S bonds, respectively. Google Scholar
- 15 A. Miura, M. Nagao, T. Takei, S. Watauchi, and I. Tanaka, J. Solid State Chem. 212, 213 (2014). 10.1016/j.jssc.2014.01.035 Crossref, Google Scholar
- 16 T. Machida, Y. Fujisawa, M. Nagao, S. Demura, K. Deguchi, Y. Mizuguchi, Y. Takano, and H. Sakata, J. Phys. Soc. Jpn. 83, 113701 (2014). 10.7566/JPSJ.83.113701 Link, Google Scholar
- 17 H. Lei, K. Wang, M. Abeykoon, E. S. Bozin, and C. Petrovic, Inorg. Chem. 52, 10685 (2013). 10.1021/ic4018135 Crossref, Google Scholar
- 18 E. S. Toberer, A. Zevalkink, and G. J. Snyder, J. Mater. Chem. 21, 15843 (2011). 10.1039/c1jm11754h Crossref, Google Scholar
- 19 J. C. Maxwell Garnett, Philos. Trans. R. Soc. London, Ser. A 203, 385 (1904); 10.1098/rsta.1904.0024 Crossref;, Google ScholarY. Zhang, T. Day, M. L. Snedaker, H. Wang, S. Krämer, C. S. Birkel, X. Ji, D. Liu, G. J. Snyder, and G. D. Stucky, Adv. Mater. 24, 5065 (2012). 10.1002/adma.201201974 Crossref, Google Scholar
- 20 I. Pallecchi, G. Lamura, M. Putti, J. Kajitani, Y. Mizuguchi, O. Miura, S. Demura, K. Deguchi, and Y. Takano, Phys. Rev. B 89, 214513 (2014). 10.1103/PhysRevB.89.214513 Crossref, Google Scholar
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