J. Phys. Soc. Jpn. 88, 114601 (2019) [9 Pages]
FULL PAPERS

Pressure-Induced Collapse of the Guest Eu Off-Centering in Type-I Clathrate Eu8Ga16Ge30

+ Affiliations
1Department of Physics, Graduate School of Science, Hiroshima University, Higashihiroshima, Hiroshima 739-8526, Japan2Department of Quantum Matter, AdSM, Hiroshima University, Higashihiroshima, Hiroshima 739-8530, Japan3Department of Applied Science for Electronics and Materials, IGSES, Kyusyu University, Kasuga, Fukuoka 816-8580, Japan4Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Sayo, Hyogo 679-5198, Japan5Synchrotron Radiation Research Center, National Institutes for Quantum and Radiological Science and Technology, Sayo, Hyogo 679-5148, Japan6ESRF-The European Synchrotron 71, Avenue des Martyrs Grenoble, France7Faculty of Pure and Applied Sciences and Tsukuba Research Center for Energy Materials Science (TREMS), University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan8Geodynamics Research Center (GRC), Ehime University, Matsuyama 790-8577, Japan

We have revealed the pressure-induced collapse of the guest Eu off-centering in type-I clathrate Eu8Ga16Ge30 by the measurements of extended X-ray absorption fine structure (EXAFS) at the Ge K-edge in a temperature range of 10–300 K. Our analysis of the EXAFS spectra at ambient pressure confirmed that the guest Eu is located in the off-centered positions at Δoffset = 0.39(1) Å away from the center of the Ga/Ge tetradodecahedron cage (14-cage). However, with applying pressure to 13.1 GPa, Δoffset decreases to zero, and the atomic density of Eu is concentrated near the center of the 14-cage with a broad distribution. The present result demonstrates a close relationship between Δoffset and the size of the cage: Δoffset decreases when the 14-cage shrinks by applying pressure. With further compression, we have observed a drastic change in the EXAFS spectra due to amorphization. In the amorphous phase, the first nearest neighbor Ge–Ga/Ge bond is longer than in the crystal phase, whereas the guest Eu atom is located randomly with respect to the Ge atoms.

©2019 The Physical Society of Japan

References

  • 1 B. C. Chakoumakos, B. C. Sales, D. Mandrus, and V. Keppens, Acta Crystallogr., Sect. B 55, 341 (1999). 10.1107/S0108768198018345 CrossrefGoogle Scholar
  • 2 T. Takabatake, K. Suekuni, T. Nakayama, and E. Kaneshita, Rev. Mod. Phys. 86, 669 (2014). 10.1103/RevModPhys.86.669 CrossrefGoogle Scholar
  • 3 G. S. Nolas, G. A. Slack, and S. B. Schujman, Semiconductor Clathrates: A Phonon Glass Electron Crystal Material with Potential for Thermoelectric Applications, Semiconductors and Semimetals (Elsevier, 2001) Vol. 69, p. 255. Google Scholar
  • 4 B. C. Sales, B. C. Chakoumakos, R. Jin, J. R. Thompson, and D. Mandrus, Phys. Rev. B 63, 245113 (2001). 10.1103/PhysRevB.63.245113 CrossrefGoogle Scholar
  • 5 K. Suekuni, M. A. Avila, K. Umeo, H. Fukuoka, S. Yamanaka, T. Nakagawa, and T. Takabatake, Phys. Rev. B 77, 235119 (2008). 10.1103/PhysRevB.77.235119 CrossrefGoogle Scholar
  • 6 M. A. Avila, K. Suekuni, K. Umeo, H. Fukuoka, S. Yamanaka, and T. Takabatake, Appl. Phys. Lett. 92, 041901 (2008). 10.1063/1.2831926 CrossrefGoogle Scholar
  • 7 R. Baumbach, F. Bridges, L. Downward, D. Cao, P. Chesler, and B. Sales, Phys. Rev. B 71, 024202 (2005). 10.1103/PhysRevB.71.024202 CrossrefGoogle Scholar
  • 8 B. C. Chakoumakos, B. C. Sales, D. G. Mandrus, and G. S. Nolas, J. Alloys Compd. 296, 80 (2000). 10.1016/S0925-8388(99)00531-9 CrossrefGoogle Scholar
  • 9 B. C. Chakoumakos, B. C. Sales, and D. G. Mandrus, J. Alloys Compd. 322, 127 (2001). 10.1016/S0925-8388(01)01169-0 CrossrefGoogle Scholar
  • 10 M. Christensen, N. Lock, J. Overgaard, and B. B. Iversen, J. Am. Chem. Soc. 128, 15657 (2006). 10.1021/ja063695y CrossrefGoogle Scholar
  • 11 M. Christensen, S. Johnsen, F. Juranyi, and B. B. Iversen, J. Appl. Phys. 105, 073508 (2009). 10.1063/1.3099589 CrossrefGoogle Scholar
  • 12 T. Kume, H. Fukuoka, T. Koda, S. Sasaki, H. Shimizu, and S. Yamanaka, Phys. Rev. Lett. 90, 155503 (2003). 10.1103/PhysRevLett.90.155503 CrossrefGoogle Scholar
  • 13 T. Kume, S. Ohno, S. Sasaki, H. Shimizu, Y. Ohishi, N. L. Okamoto, K. Kishida, K. Tanaka, and H. Inui, J. Appl. Phys. 107, 013517 (2010). 10.1063/1.3276153 CrossrefGoogle Scholar
  • 14 A. S. Miguel, A. Merlen, P. Toulemonde, T. Kume, S. L. Floch, A. Aouizerat, S. Pascarelli, G. Aquilanti, O. Mathon, T. L. Bihan, J.-P. Itie, and S. Yamanaka, Europhys. Lett. 69, 556 (2005). 10.1209/epl/i2004-10387-x CrossrefGoogle Scholar
  • 15 C. A. Tulk, A. M. dos Santos, J. C. Neuefeind, J. J. Molaison, B. C. Sales, and V. Honkimaki, Appl. Phys. Lett. 106, 021911 (2015). 10.1063/1.4905224 CrossrefGoogle Scholar
  • 16 J. R. L. Mardegan, G. Fabbris, L. S. I. Veiga, C. Adriano, M. A. Avila, D. Haskel, and C. Giles, Phys. Rev. B 88, 144105 (2013). 10.1103/PhysRevB.88.144105 CrossrefGoogle Scholar
  • 17 S. Paschen, W. Carrillo-Cabrera, A. Bentien, V. H. Tran, M. Baenitz, Y. Grin, and F. Steglich, Phys. Rev. B 64, 214404 (2001). 10.1103/PhysRevB.64.214404 CrossrefGoogle Scholar
  • 18 T. Onimaru, S. Tsutsui, M. Mizumaki, N. Kawamura, N. Ishimatsu, M. A. Avila, S. Yamamoto, H. Yamane, K. Suekuni, K. Umeo, T. Kume, S. Nakano, and T. Takabatake, J. Phys. Soc. Jpn. 83, 013701 (2014). 10.7566/JPSJ.83.013701 LinkGoogle Scholar
  • 19 K. Momma and F. Izumi, J. Appl. Crystallogr. 44, 1272 (2011). 10.1107/S0021889811038970 CrossrefGoogle Scholar
  • 20 N. Kawamura, N. Ishimatsu, and H. Maruyama, J. Synchrotron Radiat. 16, 730 (2009). 10.1107/S0909049509034700 CrossrefGoogle Scholar
  • 21 O. Mathon, A. Beteva, J. Borrel, D. Bugnazet, S. Gatla, R. Hino, I. Kantor, T. Mairs, M. Munoz, S. Pasternak, F. Perrin, and S. Pascarelli, J. Synchrotron Radiat. 22, 1548 (2015). 10.1107/S1600577515017786 CrossrefGoogle Scholar
  • 22 T. Irifune, A. Kurio, S. Sakamoto, T. Inoue, and H. Sumiya, Nature (London) 421, 599 (2003). 10.1038/421599b CrossrefGoogle Scholar
  • 23 N. Ishimatsu, K. Matsumoto, H. Maruyama, N. Kawamura, M. Mizumaki, H. Sumiya, and T. Irifune, J. Synchrotron Radiat. 19, 768 (2012). 10.1107/S0909049512026088 CrossrefGoogle Scholar
  • 24 B. Ravel and M. Newville, J. Synchrotron Radiat. 12, 537 (2005). 10.1107/S0909049505012719 CrossrefGoogle Scholar
  • 25 D. Y. Kim and T. Kume, Jpn. J. Appl. Phys. 56, 05FA07 (2017). 10.7567/JJAP.56.05FA07 CrossrefGoogle Scholar
  • 26 For example, F. Jalilehvand, Chem. Soc. Rev. 35, 1256 (2006). 10.1039/B417595FThis paper is a sophisticated study on the relation between E0 and valence state covering both anion and cation. CrossrefGoogle Scholar
  • 27 R. Bacewicz and J. Antonowicz, Scr. Mater. 54, 1187 (2006). 10.1016/j.scriptamat.2005.11.033 CrossrefGoogle Scholar
  • 28 M. Vaccari, G. Aquilanti, S. Pascarelli, and O. Mathon, J. Phys.: Condens. Matter 21, 145403 (2009). 10.1088/0953-8984/21/14/145403 CrossrefGoogle Scholar
  • 29 G. Bunker, Introduction to XAFS (Cambridge University Press, Cambridge, U.K., 2010) p. 85. CrossrefGoogle Scholar
  • 30 Y. Jiang, F. Bridges, M. A. Avila, T. Takabatake, J. Guzman, and G. Kurczveil, Phys. Rev. B 78, 014111 (2008). 10.1103/PhysRevB.78.014111 CrossrefGoogle Scholar
  • 31 Y. Zhang, P. L. Lee, G. S. Nolas, and A. P. Wilkinson, Appl. Phys. Lett. 80, 2931 (2002). 10.1063/1.1473236 CrossrefGoogle Scholar
  • 32 T. Keiber, P. Nast, S. Medling, F. Bridges, K. Suekuni, M. A. Avila, and T. Takabatake, J. Mater. Chem. C 3, 10574 (2015). 10.1039/C5TC01641J CrossrefGoogle Scholar
  • 33 A. N. Mansour, J. Martin, W. Wong-Ng, and G. S. Nolas, J. Phys.: Condens. Matter 24, 485503 (2012). 10.1088/0953-8984/24/48/485503 CrossrefGoogle Scholar
  • 34 E. Sevillano, H. Meuth, and J. J. Rehr, Phys. Rev. B 20, 4908 (1979). 10.1103/PhysRevB.20.4908 CrossrefGoogle Scholar
  • 35 E. A. Stern, J. Synchrotron Radiat. 8, 49 (2001). 10.1107/S0909049500014138 CrossrefGoogle Scholar
  • 36 Y. Takasu, T. Hasegawa, N. Ogita, M. Udagawa, M. A. Avila, K. Suekuni, I. Ishii, T. Suzuki, and T. Takabatake, Phys. Rev. B 74, 174303 (2006). 10.1103/PhysRevB.74.174303 CrossrefGoogle Scholar
  • 37 Y. Takasu, T. Hasegawa, N. Ogita, M. Udagawa, M. A. Avila, K. Suekuni, and T. Takabatake, Phys. Rev. Lett. 100, 165503 (2008). 10.1103/PhysRevLett.100.165503 CrossrefGoogle Scholar
  • 38 J. S. Tse, Z. Kristallogr. 220, 521 (2005). 10.1524/zkri.220.5.521.65069 CrossrefGoogle Scholar