J. Phys. Soc. Jpn. 89, 051012 (2020) [7 Pages]
SPECIAL TOPICS: Frontier of Hydrogen Science

Metal Hydrides: Epitaxial Growth and Electronic Properties

+ Affiliations
1School of Materials and Chemical Technology, Tokyo Institute of Technology, Meguro, Tokyo 152-8552, Japan2PRESTO, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan3WPI-Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, Sendai 980-8579, Japan4New Industry Creation Hatchery Center (NICHe), Tohoku University, Sendai 980-8579, Japan

Reports of superconductivity at temperatures above 200 K in high-pressure hydrogen sulfide (H2S) had generated great interest in metal hydrides and their physical properties. For the progress in both fundamental understanding and device application of metal hydrides, studies using single crystals or epitaxial thin films are essential. However, to date, a few metal hydride single crystals and epitaxial thin films have been fabricated, and both fundamental and applied research on these materials remain elusive compared with oxides and nitrides. This article reviews the recent body of work that aims to establish a metal-hydride epitaxial thin film synthesis technology, and to search for new metal-hydride functionalities; it focuses on the epitaxial growth and properties of metal hydrides.

©2020 The Physical Society of Japan


  • 1 R. Mohtadi and S. Orimo, Nat. Rev. Mater. 2, 16091 (2017). 10.1038/natrevmats.2016.91 CrossrefGoogle Scholar
  • 2 A. Unemoto, M. Matsuo, and S. Orimo, Adv. Funct. Mater. 24, 2267 (2014). 10.1002/adfm.201303147 CrossrefGoogle Scholar
  • 3 G. Kobayashi, Y. Hinuma, S. Matsuoka, A. Watanabe, M. Iqbal, M. Hirayama, M. Yonemura, T. Kamiyama, I. Tanaka, and R. Kanno, Science 351, 1314 (2016). 10.1126/science.aac9185 CrossrefGoogle Scholar
  • 4 K. Fukui, S. Iimura, T. Tada, S. Fujitsu, M. Sasase, H. Tamatsukuri, T. Honda, K. Ikeda, T. Otomo, and H. Hosono, Nat. Commun. 10, 2578 (2019). 10.1038/s41467-019-10492-7 CrossrefGoogle Scholar
  • 5 T. Mongstad, C. Platzer-Björkman, J. P. Maehlen, L. P. A. Mooij, Y. Pivak, B. Dam, E. S. Marstein, B. C. Hauback, and S. Zh. Karazhanov, Sol. Energy Mater. Sol. Cells 95, 3596 (2011). 10.1016/j.solmat.2011.08.018 CrossrefGoogle Scholar
  • 6 A. P. Drozdov, M. I. Eremets, I. A. Troyan, V. Ksenofontov, and S. I. Shylin, Nature 525, 73 (2015). 10.1038/nature14964 CrossrefGoogle Scholar
  • 7 M. Somayazulu, M. Ahart, A. K. Mishra, Z. M. Geballe, M. Baldini, Y. Meng, V. V. Struzhkin, and R. J. Hemley, Phys. Rev. Lett. 122, 027001 (2019). 10.1103/PhysRevLett.122.027001 CrossrefGoogle Scholar
  • 8 L. Pauling, J. Am. Chem. Soc. 54, 3570 (1932). 10.1021/ja01348a011 CrossrefGoogle Scholar
  • 9 A. L. Allred, J. Inorg. Nucl. Chem. 17, 215 (1961). 10.1016/0022-1902(61)80142-5 CrossrefGoogle Scholar
  • 10 R. D. Shannon, Acta Crystallogr., Sect. A 32, 751 (1976). 10.1107/S0567739476001551 CrossrefGoogle Scholar
  • 11 Y. Furubayashi, T. Hitosugi, Y. Yamamoto, K. Inaba, G. Kinoda, Y. Hirose, T. Shimada, and T. Hasegawa, Appl. Phys. Lett. 86, 252101 (2005). 10.1063/1.1949728 CrossrefGoogle Scholar
  • 12 T. Hitosugi, N. Yamada, S. Nakao, Y. Hirose, and T. Hasegawa, Phys. Status Solidi A 207, 1529 (2010). 10.1002/pssa.200983774 CrossrefGoogle Scholar
  • 13 Y. Okada, Y. Ando, R. Shimizu, E. Minamitani, S. Shiraki, S. Watanabe, and T. Hitosugi, Nat. Commun. 8, 15975 (2017). 10.1038/ncomms15975 CrossrefGoogle Scholar
  • 14 K. Iwaya, T. Ohsawa, R. Shimizu, Y. Okada, and T. Hitosugi, Sci. Technol. Adv. Mater. 19, 282 (2018). 10.1080/14686996.2018.1442616 CrossrefGoogle Scholar
  • 15 M. Haruta, S. Shiraki, T. Ohsawa, T. Suzuki, A. Kumatani, Y. Takagi, R. Shimizu, and T. Hitosugi, Solid State Ionics 285, 118 (2016). 10.1016/j.ssi.2015.06.007 CrossrefGoogle Scholar
  • 16 M. Haruta, S. Shiraki, T. Suzuki, A. Kumatani, T. Ohsawa, Y. Takagi, R. Shimizu, and T. Hitosugi, Nano Lett. 15, 1498 (2015). 10.1021/nl5035896 CrossrefGoogle Scholar
  • 17 M. Wilde and K. Fukutani, Surf. Sci. Rep. 69, 196 (2014). 10.1016/j.surfrep.2014.08.002 CrossrefGoogle Scholar
  • 18 D. Sekiba, in Compend. Surf. Interface Anal. (Springer, 2018) p. 67. CrossrefGoogle Scholar
  • 19 T. Hanna, H. Hiramatsu, I. Sakaguchi, and H. Hosono, Rev. Sci. Instrum. 88, 053103 (2017). 10.1063/1.4982255 CrossrefGoogle Scholar
  • 20 J. Hayoz, Th. Pillo, M. Bovet, A. Züttel, St. Guthrie, G. Pastore, L. Schlapbach, and P. Aebi, J. Vac. Sci. Technol. A 18, 2417 (2000). 10.1116/1.1286073 CrossrefGoogle Scholar
  • 21 T. J. Udovic, Q. Huang, R. W. Erwin, B. Hjörvarsson, and R. C. C. Ward, Phys. Rev. B 61, 12701 (2000). 10.1103/PhysRevB.61.12701 CrossrefGoogle Scholar
  • 22 P. Tessier, D. Fruchart, and D. Givord, J. Alloys Compd. 330–332, 369 (2002). 10.1016/S0925-8388(01)01639-5 CrossrefGoogle Scholar
  • 23 A. Remhof and A. Borgschulte, ChemPhysChem 9, 2440 (2008). 10.1002/cphc.200800573 CrossrefGoogle Scholar
  • 24 S. Orimo, Y. Nakamori, J. R. Eliseo, A. Züttel, and C. M. Jensen, Chem. Rev. 107, 4111 (2007). 10.1021/cr0501846 CrossrefGoogle Scholar
  • 25 P. A. Varotsos and S. Mourikis, Phys. Rev. B 10, 5220 (1974). 10.1103/PhysRevB.10.5220 CrossrefGoogle Scholar
  • 26 J. Y. Zhang, L. J. Zhang, T. Cui, Y. L. Niu, Y. M. Ma, Z. He, and G. T. Zou, J. Phys.: Condens. Matter 19, 425218 (2007). 10.1088/0953-8984/19/42/425218 CrossrefGoogle Scholar
  • 27 H. Oguchi, T. Ikeshoji, T. Ohsawa, S. Shiraki, H. Kuwano, S. Orimo, and T. Hitosugi, Appl. Phys. Lett. 105, 211601 (2014). 10.1063/1.4902446 CrossrefGoogle Scholar
  • 28 H. Oguchi, S. Isobe, H. Kuwano, S. Shiraki, S. Orimo, and T. Hitosugi, APL Mater. 3, 096106 (2015). 10.1063/1.4931080 CrossrefGoogle Scholar
  • 29 K. Yoshimatsu, T. Suzuki, N. Tsuchimine, K. Horiba, H. Kumigashira, T. Oshima, and A. Ohtomo, Appl. Phys. Express 8, 035801 (2015). 10.7567/APEX.8.035801 CrossrefGoogle Scholar
  • 30 A. Nishi, K. Yoshimatsu, and A. Ohtomo, 65th JSAP Spring Meeting, 17p-C103-8, 2018. Google Scholar
  • 31 R. J. Westerwaal, C. P. Broedersz, R. Gremaud, M. Slaman, A. Borgschulte, W. Lohstroh, K. G. Tschersich, H. P. Fleischhauer, B. Dam, and R. Griessen, Thin Solid Films 516, 4351 (2008). 10.1016/j.tsf.2007.12.163 CrossrefGoogle Scholar
  • 32 S. Yatsuya, Nihon Kessho Gakkaishi 29, 311 (1987). 10.5940/jcrsj.29.311 CrossrefGoogle Scholar
  • 33 R. Shimizu, Y. Sasahara, H. Oguchi, K. Yamamoto, I. Sugiyama, S. Shiraki, S. Orimo, and T. Hitosugi, APL Mater. 5, 086102 (2017). 10.1063/1.4996984 CrossrefGoogle Scholar
  • 34 Y. Sasahara, R. Shimizu, H. Oguchi, K. Nishio, S. Ogura, H. Morioka, S. Orimo, K. Fukutani, and T. Hitosugi, AIP Adv. 9, 015027 (2019). 10.1063/1.5066367 CrossrefGoogle Scholar
  • 35 R. Shimizu, T. Kakinokizono, I. Gu, and T. Hitosugi, Inorg. Chem. 58, 15354 (2019). 10.1021/acs.inorgchem.9b02399 CrossrefGoogle Scholar
  • 36 Y. Komatsu, R. Shimizu, Y. Sasahara, K. Nishio, H. Oguchi, S. Orimo, and T. Hitosugi, 65th JSAP Spring Meeting, 17p-C103-9, 2018. Google Scholar
  • 37 Y. Komatsu, R. Shimizu, S. Kobayashi, K. Nishio, K. Shigematsu, M. Azuma, A. Ohtomo, and T. Hitosugi, unpublished. Google Scholar
  • 38 Y. Komatsu, R. Shimizu, R. Sato, M. Wilde, M. Miyauchi, K. Fukutani, S. Tsuneyuki, and T. Hitosugi, unpublished. Google Scholar
  • 39 S.-M. Chon, R. Shimizu, S. Kobayashi, and T. Hitosugi, unpublished. Google Scholar
  • 40 S. Kim, H. Oguchi, N. Toyama, T. Sato, S. Takagi, T. Otomo, D. Arunkumar, N. Kuwata, J. Kawamura, and S. Orimo, Nat. Commun. 10, 1081 (2019). 10.1038/s41467-019-09061-9 CrossrefGoogle Scholar
  • 41 M. Filippi, J. H. Rector, R. Gremaud, M. J. van Setten, and B. Dam, Appl. Phys. Lett. 95, 121904 (2009). 10.1063/1.3236525 CrossrefGoogle Scholar
  • 42 W. Haiping, W. Weidong, L. Tiecheng, W. Xuemin, G. Fangfang, C. Linhong, B. Li, and D. Yang, Mater. Lett. 64, 320 (2010). 10.1016/j.matlet.2009.11.003 CrossrefGoogle Scholar
  • 43 S. Maruyama, Y. Takeyama, H. Taniguchi, H. Fukumoto, M. Itoh, H. Kumigashira, M. Oshima, T. Yamamoto, and Y. Matsumoto, ACS Nano 4, 5946 (2010). 10.1021/nn101036v CrossrefGoogle Scholar
  • 44 H. Oguchi, S. Kim, S. Maruyama, Y. Horisawa, S. Takagi, T. Sato, R. Shimizu, Y. Matsumoto, T. Hitosugi, and S. Orimo, ACS Appl. Electron. Mater. 1, 1792 (2019). 10.1021/acsaelm.9b00350 CrossrefGoogle Scholar
  • 45 R. Shimizu, Y. Sasahara, I. Hamada, H. Oguchi, S. Ogura, T. Shirasawa, M. Kitamura, K. Horiba, H. Kumigashira, S. Orimo, K. Fukutani, and T. Hitosugi, (submitted). Google Scholar
  • 46 S. Cornelius, G. Colombi, F. Nafezarefi, H. Schreuders, R. Heller, F. Munnik, and B. Dam, J. Phys. Chem. Lett. 10, 1342 (2019). 10.1021/acs.jpclett.9b00088 CrossrefGoogle Scholar
  • 47 S. Iwai, M. Ono, A. Maeda, H. Matsuzaki, H. Kishida, H. Okamoto, and Y. Tokura, Phys. Rev. Lett. 91, 057401 (2003). 10.1103/PhysRevLett.91.057401 CrossrefGoogle Scholar
  • 48 L. Perfetti, P. A. Loukakos, M. Lisowski, U. Bovensiepen, H. Berger, S. Biermann, P. S. Cornaglia, A. Georges, and M. Wolf, Phys. Rev. Lett. 97, 067402 (2006). 10.1103/PhysRevLett.97.067402 CrossrefGoogle Scholar
  • 49 S. Koshihara and S. Adachi, J. Phys. Soc. Jpn. 75, 011005 (2006). 10.1143/JPSJ.75.011005 LinkGoogle Scholar
  • 50 H. Okamoto, H. Matsuzaki, T. Wakabayashi, Y. Takahashi, and T. Hasegawa, Phys. Rev. Lett. 98, 037401 (2007). 10.1103/PhysRevLett.98.037401 CrossrefGoogle Scholar
  • 51 K. Hayashi, S. Matsuishi, T. Kamiya, M. Hirano, and H. Hosono, Nature 419, 462 (2002). 10.1038/nature01053 CrossrefGoogle Scholar
  • 52 N. Huiberts, R. Griessen, and H. Rector, Nature 380, 231 (1996). 10.1038/380231a0 CrossrefGoogle Scholar
  • 53 M. Matsuo, Y. Nakamori, S. Orimo, H. Maekawa, and H. Takamura, Appl. Phys. Lett. 91, 224103 (2007). 10.1063/1.2817934 CrossrefGoogle Scholar
  • 54 H. Maekawa, M. Matsuo, H. Takamura, M. Ando, Y. Noda, T. Karahashi, and S. Orimo, J. Am. Chem. Soc. 131, 894 (2009). 10.1021/ja807392k CrossrefGoogle Scholar
  • 55 H. Oguchi, M. Matsuo, J. S. Hummelshøj, T. Vegge, J. K. Nørskov, T. Sato, Y. Miura, H. Takamura, H. Maekawa, and S. Orimo, Appl. Phys. Lett. 94, 141912 (2009). 10.1063/1.3117227 CrossrefGoogle Scholar
  • 56 R. Shimizu and T. Hitosugi, in AI Revolut. Coexists People (NTS Inc., 2019) p. 373. Google Scholar
  • 57 Y. Sasahara, K. Kanatani, H. Asoma, M. Matsuhisa, K. Nishio, R. Shimizu, N. Nishiyama, and T. Hitosugi, AIP Adv. 10, 025125 (2020). 10.1063/1.5129422 CrossrefGoogle Scholar