J. Phys. Soc. Jpn. 88, 044003 (2019) [7 Pages]
FULL PAPERS

Bayesian Spectral Deconvolution Based on Poisson Distribution: Bayesian Measurement and Virtual Measurement Analytics (VMA)

+ Affiliations
1National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-0045, Japan2Japan Science and Technology Agency, PRESTO, Kawaguchi, Saitama 332-0012, Japan3Research and Services Division of Materials Data and Integrated Systems, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan4Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan

In this paper, we propose a new method of Bayesian measurement for spectral deconvolution, which regresses spectral data into the sum of unimodal basis function such as Gaussian or Lorentzian functions. Bayesian measurement is a framework for considering not only the target physical model but also the measurement model as a probabilistic model, and enables us to estimate the parameter of a physical model with its confidence interval through a Bayesian posterior distribution given a measurement data set. The measurement with Poisson noise is one of the most effective system to apply our proposed method. Since the measurement time is strongly related to the signal-to-noise ratio for the Poisson noise model, Bayesian measurement with Poisson noise model enables us to clarify the relationship between the measurement time and the limit of estimation. In this study, we establish the probabilistic model with Poisson noise for spectral deconvolution. Bayesian measurement enables us to perform virtual and computer simulation for a certain measurement through the established probabilistic model. This property is called “Virtual Measurement Analytics (VMA)” in this paper. We also show that the relationship between the measurement time and the limit of estimation can be extracted by using the proposed method in a simulation of synthetic data and real data for XPS measurement of MoS2.

©2019 The Physical Society of Japan

References

  • 1 J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of Photoelectron Spectroscopy (Perkin-Elmer, Eden Prairie, MN, 1992). Google Scholar
  • 2 K. Nagata, S. Sugita, and M. Okada, Neural Networks 28, 82 (2012). 10.1016/j.neunet.2011.12.001 CrossrefGoogle Scholar
  • 3 S. Tokuda, K. Nagata, and M. Okada, J. Phys. Soc. Jpn. 86, 024001 (2017). 10.7566/JPSJ.86.024001 LinkGoogle Scholar
  • 4 Y. Hagimoto, T. Fujita, K. Ono, H. Fujioka, M. Oshima, K. Hirose, and M. Tajima, Appl. Phys. Lett. 74, 2011 (1999). 10.1063/1.123730 CrossrefGoogle Scholar
  • 5 Z. W. Deng, R. W. M. Kwok, W. M. Lau, and L. L. Cao, Appl. Surf. Sci. 158, 58 (2000). 10.1016/S0169-4332(99)00589-9 CrossrefGoogle Scholar
  • 6 D. A. Shirley, Phys. Rev. B 5, 4709 (1972). 10.1103/PhysRevB.5.4709 CrossrefGoogle Scholar
  • 7 K. Hukushima and K. Nemoto, J. Phys. Soc. Jpn. 65, 1604 (1996). 10.1143/JPSJ.65.1604 LinkGoogle Scholar
  • 8 Y. Ogata, Ann. Inst. Stat. Math. 42, 403 (1990). 10.1007/BF00049299 CrossrefGoogle Scholar
  • 9 K. Nagata and S. Watanabe, Neural Networks 21, 980 (2008). 10.1016/j.neunet.2007.11.002 CrossrefGoogle Scholar
  • 10 M. A. Baker, R. Gilmore, C. Lenardi, and W. Gissler, Appl. Surf. Sci. 150, 255 (1999). 10.1016/S0169-4332(99)00253-6 CrossrefGoogle Scholar
  • 11 R. Wahab, S. G. Ansari, Y. S. Kim, H. K. Seo, G. S. Kim, G. Khang, and H. S. Shin, Mater. Res. Bull. 42, 1640 (2007). 10.1016/j.materresbull.2006.11.035 CrossrefGoogle Scholar